Transmission electron microscopy and diffractometry of materials / Brent Fultz, James M. Howe
| Main Author: | Fultz, Brent |
|---|---|
| Other Authors: | Howe, James M. |
| Format: | MONOGRAPHS |
| Language: | English |
| Published: |
Berlin : Springer, 2008 |
| Edition: | 3rd ed. |
| Subjects: |
Materials --
> Microscopy.
Transmission electron microscopy. X-ray diffractometer. Surfaces (Physics) Crystallography. Particles (Nuclear physics) Chemistry. X-rays -- > Diffraction. |
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| LEADER | 01087nam a2200289 a 4500 | ||
|---|---|---|---|
| 001 | 0056047 | ||
| 003 | Th-MUT | ||
| 008 | 181106s9999 xx 000 0 eng d | ||
| 020 | |a 9783540738862 | ||
| 040 | |a DLC |c MUT | ||
| 050 | 4 | |a TA417.23 |b F94T73 2008 | |
| 100 | 1 | |a Fultz, Brent | |
| 245 | 1 | 0 | |a Transmission electron microscopy and diffractometry of materials |b / |c Brent Fultz, James M. Howe |
| 250 | |a 3rd ed. | ||
| 260 | |a Berlin : |b Springer, |c 2008 | ||
| 300 | |a xix, 758 p. : |b illus. ; |c 14 cm. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 650 | 0 | |a Materials -- |x Microscopy. | |
| 650 | 0 | |a Transmission electron microscopy. | |
| 650 | 0 | |a X-ray diffractometer. | |
| 650 | 0 | |a Surfaces (Physics) | |
| 650 | 0 | |a Crystallography. | |
| 650 | 0 | |a Particles (Nuclear physics) | |
| 650 | 0 | |a Chemistry. | |
| 650 | 0 | |a X-rays -- |x Diffraction. | |
| 700 | 1 | |a Howe, James M. | |
| 991 | |a MONOGRAPHS |b 13 |c 2018-11-07 04:40:07 |d 2022-09-04 14:50:30 |e mut |f n |g 2018-11-07 |h n |i a |j m |k |l a |m |n a |o |p b |q |r gw |s eng |t 2008 |u 3rd ed. |v Transmission electron microscopy and diffractometry of materials / | ||