Transmission electron microscopy and diffractometry of materials / Brent Fultz, James M. Howe
| Main Author: | Fultz, Brent |
|---|---|
| Other Authors: | Howe, James M. |
| Format: | MONOGRAPHS |
| Language: | English |
| Published: |
Berlin : Springer, 2008 |
| Edition: | 3rd ed. |
| Subjects: |
Materials --
> Microscopy.
Transmission electron microscopy. X-ray diffractometer. Surfaces (Physics) Crystallography. Particles (Nuclear physics) Chemistry. X-rays -- > Diffraction. |
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| Physical Description: |
xix, 758 p. : illus. ; 14 cm. |
|---|---|
| Bibliography: |
Includes bibliographical references and index. |
| ISBN: |
9783540738862 |