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Transmission electron microscopy and diffractometry of materials / Brent Fultz, James M. Howe

Main Author: Fultz, Brent
Other Authors: Howe, James M.
Format: MONOGRAPHS
Language: English
Published: Berlin : Springer, 2008
Edition: 3rd ed.
Subjects: Materials -- > Microscopy.
Transmission electron microscopy.
X-ray diffractometer.
Surfaces (Physics)
Crystallography.
Particles (Nuclear physics)
Chemistry.
X-rays -- > Diffraction.
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MUT Lib 3rd Floor

Call Number: TA417.23 F94T73 2008
1 - Copy 1
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