Digital system testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
| Main Author: | Abramovici, Miron |
|---|---|
| Other Authors: | Breuer, Melvin A., Friedman, Arthur D. |
| Format: | MONOGRAPHS |
| Language: | English |
| Published: |
New York : Computer Science Press, 1990 |
| Series: |
Electrical engineering, communications and signal processing series
|
| Subjects: |
Digital integrated circuits
Digital integrated circuits |
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| 040 | |a DLC |c MUT | ||
| 050 | 4 | |a TK7874.A23 |b A27D53 | |
| 100 | 1 | |a Abramovici, Miron | |
| 245 | 1 | 0 | |a Digital system testing and testable design |b / |c Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman |
| 260 | |a New York : |b Computer Science Press, |c 1990 | ||
| 300 | |a xxi, 653 p. : |b illus. ; |c 24 cm. | ||
| 440 | 0 | |a Electrical engineering, communications and signal processing series | |
| 504 | |a Includes bibliographical references and index. | ||
| 650 | 0 | |a Digital integrated circuits | |
| 650 | 0 | |a Digital integrated circuits | |
| 700 | 1 | |a Breuer, Melvin A. | |
| 700 | 1 | |a Friedman, Arthur D. | |
| 991 | |a MONOGRAPHS |b 4 |c 2018-11-06 19:27:24 |d 2021-10-27 14:39:14 |e mut |f n |g null |h n |i a |j m |k |l a |m |n a |o |p b |q |r nyu |s eng |t 1990 |v Digital system testing and testable design / | ||