Digital system testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
| Main Author: | Abramovici, Miron |
|---|---|
| Other Authors: | Breuer, Melvin A., Friedman, Arthur D. |
| Format: | MONOGRAPHS |
| Language: | English |
| Published: |
New York : Computer Science Press, 1990 |
| Series: |
Electrical engineering, communications and signal processing series
|
| Subjects: |
Digital integrated circuits
Digital integrated circuits |
| Tags: |
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| Physical Description: |
xxi, 653 p. : illus. ; 24 cm. |
|---|---|
| Bibliography: |
Includes bibliographical references and index. |
| ISBN: |
0716781794 |