Microstructural characterization of materials / David Brandon, Wayne D. Kaplan
| Main Author: | Brandon, David |
|---|---|
| Other Authors: | Kaplan, Wayne D. |
| Format: | MONOGRAPHS |
| Language: | English |
| Published: |
Chichester, England : John Wiley & Sons, 2008 |
| Edition: | 2nd ed. |
| Series: |
Quantitative software engineering series
|
| Subjects: |
Materials --
> Microscopy.
Microstructure. |
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| 003 | Th-MUT | ||
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| 020 | |a 0470027851 |c 3360 | ||
| 040 | |a DLC |c MUT | ||
| 050 | 4 | |a TA417.23 |b B73M53 2008 | |
| 100 | 1 | |a Brandon, David | |
| 245 | 1 | 0 | |a Microstructural characterization of materials |b / |c David Brandon, Wayne D. Kaplan |
| 250 | |a 2nd ed. | ||
| 260 | |a Chichester, England : |b John Wiley & Sons, |c 2008 | ||
| 300 | |a xiv, 536 p. : |b illus. ; |c 24 cm. | ||
| 440 | 0 | |a Quantitative software engineering series | |
| 504 | |a Includes bibliographical references and index. | ||
| 650 | 0 | |a Materials -- |x Microscopy. | |
| 650 | 0 | |a Microstructure. | |
| 700 | 1 | |a Kaplan, Wayne D. | |
| 991 | |a MONOGRAPHS |b 7 |c 2018-11-06 22:16:21 |d 2022-05-09 15:55:39 |e mut |f n |g null |h n |i a |j m |k |l a |m |n a |o |p b |q |r enk |s eng |t 2008 |u 2nd ed. |v Microstructural characterization of materials / | ||