Microstructural characterization of materials / David Brandon, Wayne D. Kaplan
| Main Author: | Brandon, David |
|---|---|
| Other Authors: | Kaplan, Wayne D. |
| Format: | MONOGRAPHS |
| Language: | English |
| Published: |
Chichester, England : John Wiley & Sons, 2008 |
| Edition: | 2nd ed. |
| Series: |
Quantitative software engineering series
|
| Subjects: |
Materials --
> Microscopy.
Microstructure. |
| Tags: |
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| Physical Description: |
xiv, 536 p. : illus. ; 24 cm. |
|---|---|
| Bibliography: |
Includes bibliographical references and index. |
| ISBN: |
0470027851 |