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Testing for EMC compliance : approaches and techniques / Mark I Montrose

Main Author: Montrose, Mark I.
Other Authors: Nakauchi, Edward M.
Format: MONOGRAPHS
Language: English
Published: Hoboken, NJ. : John Wiley & Sons, 2004
Subjects: Electromagnetic compatibility.
Electromagnetic interference.
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LEADER 00745nam a2200193 a 4500
001 0039381
003 Th-MUT
008 181106s9999 xx 000 0 eng d
020 |a 047143308x  |c 2420 
040 |a DLC  |c MUT 
050 4 |a TK7867.2  |b M66T88 
100 1 |a Montrose, Mark I. 
245 1 0 |a Testing for EMC compliance : approaches and techniques  |b /  |c Mark I Montrose 
260 |a Hoboken, NJ. :  |b John Wiley & Sons,  |c 2004 
300 |a 460 p. :  |c 24 cm. 
650 0 |a Electromagnetic compatibility. 
650 0 |a Electromagnetic interference. 
700 1 |a Nakauchi, Edward M. 
991 |a MONOGRAPHS  |b 3  |c 2018-11-06 22:13:19  |d 2021-12-15 17:06:35  |e mut  |f n  |g null  |h n  |i a  |j m  |k    |l a  |m    |n a  |o    |p b  |q    |r nju  |s eng  |t 2004   |v Testing for EMC compliance : approaches and techniques / 

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