Testing for EMC compliance : approaches and techniques / Mark I Montrose
Main Author: | Montrose, Mark I. |
---|---|
Other Authors: | Nakauchi, Edward M. |
Format: | MONOGRAPHS |
Language: | English |
Published: |
Hoboken, NJ. : John Wiley & Sons, 2004 |
Subjects: |
Electromagnetic compatibility.
Electromagnetic interference. |
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100 | 1 | |a Montrose, Mark I. | |
245 | 1 | 0 | |a Testing for EMC compliance : approaches and techniques |b / |c Mark I Montrose |
260 | |a Hoboken, NJ. : |b John Wiley & Sons, |c 2004 | ||
300 | |a 460 p. : |c 24 cm. | ||
650 | 0 | |a Electromagnetic compatibility. | |
650 | 0 | |a Electromagnetic interference. | |
700 | 1 | |a Nakauchi, Edward M. | |
991 | |a MONOGRAPHS |b 3 |c 2018-11-06 22:13:19 |d 2021-12-15 17:06:35 |e mut |f n |g null |h n |i a |j m |k |l a |m |n a |o |p b |q |r nju |s eng |t 2004 |v Testing for EMC compliance : approaches and techniques / |