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Testing for EMC compliance : approaches and techniques / Mark I Montrose

Main Author: Montrose, Mark I.
Other Authors: Nakauchi, Edward M.
Format: MONOGRAPHS
Language: English
Published: Hoboken, NJ. : John Wiley & Sons, 2004
Subjects: Electromagnetic compatibility.
Electromagnetic interference.
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Physical Description: 460 p. : 24 cm.
ISBN: 047143308x

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