VuFind

Design to reduce technical risk / AT & T

Other Authors: AT&T
Format: MONOGRAPHS
Language: English
Published: New York : McGraw-Hill, 1993
Series: Practical engineering guides for managing risk
Subjects: Computer-aided design.
Engineering design.
Tags: Add
No Tags, Be the first to tag this record!
  • Be the first to leave a comment!

Similar Items

Search Options

Find More

Need Help?