Design to reduce technical risk / AT & T
| Other Authors: | AT&T |
|---|---|
| Format: | MONOGRAPHS |
| Language: | English |
| Published: |
New York : McGraw-Hill, 1993 |
| Series: |
Practical engineering guides for managing risk
|
| Subjects: |
Computer-aided design.
Engineering design. |
| Tags: |
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| 040 | |a DLC |c MUT | ||
| 050 | 4 | |a TA174 |b D485 | |
| 245 | 1 | 0 | |a Design to reduce technical risk |b / |c AT & T |
| 260 | |a New York : |b McGraw-Hill, |c 1993 | ||
| 300 | |a xvi, 752 p. : |b illus. ; |c 21 cm. | ||
| 440 | 0 | |a Practical engineering guides for managing risk | |
| 504 | |a Includes bibliographical reference. | ||
| 650 | 0 | |a Computer-aided design. | |
| 650 | 0 | |a Engineering design. | |
| 710 | 2 | |a AT&T | |
| 991 | |a MONOGRAPHS |b 10 |c 2018-11-07 00:08:51 |d 2021-11-25 08:12:05 |e mut |f n |g null |h n |i a |j m |k |l a |m |n a |o |p b |q |r nyu |s eng |t 1993 |v Design to reduce technical risk / | ||
