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Design to reduce technical risk / AT & T

Other Authors: AT&T
Format: MONOGRAPHS
Language: English
Published: New York : McGraw-Hill, 1993
Series: Practical engineering guides for managing risk
Subjects: Computer-aided design.
Engineering design.
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008 181106s9999 xx 000 0 eng d
020 |a 0070025614 
040 |a DLC  |c MUT 
050 4 |a TA174  |b D485 
245 1 0 |a Design to reduce technical risk  |b /  |c AT & T 
260 |a New York :  |b McGraw-Hill,  |c 1993 
300 |a xvi, 752 p. :  |b illus. ;  |c 21 cm. 
440 0 |a Practical engineering guides for managing risk 
504 |a Includes bibliographical reference. 
650 0 |a Computer-aided design. 
650 0 |a Engineering design. 
710 2 |a AT&T 
991 |a MONOGRAPHS  |b 10  |c 2018-11-07 00:08:51  |d 2021-11-25 08:12:05  |e mut  |f n  |g null  |h n  |i a  |j m  |k    |l a  |m    |n a  |o    |p b  |q    |r nyu  |s eng  |t 1993   |v Design to reduce technical risk / 

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