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Semiconductor memories : technology, testing and reliability / Ashok K. Sharma

Main Author: Sharma, Ashok K.
Format: MONOGRAPHS
Language: English
Published: New York : IEEE Press, 1997
Subjects: Semiconductor storage devices.
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245 1 0 |a Semiconductor memories : technology, testing and reliability  |b /  |c Ashok K. Sharma 
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300 |a 462 p. :  |b illus. ;  |c 26 cm. 
500 |a Includes index. 
650 0 |a Semiconductor storage devices. 
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