Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits / Michael L. Bushnell, Vishwani D. Agrawal
| Main Author: | Bushnell, Michael L. |
|---|---|
| Other Authors: | Agrawal, Vishwani D. |
| Format: | MONOGRAPHS |
| Language: | English |
| Published: |
Boston, MA. : Kluwer Academic Pub., 2000 |
| Subjects: |
Digital integrated circuits --
> Testing.
Integrated circuits -- > Very large scale integration -- > Testing. Mixed signal circuits -- > Testing. Semiconductor storage devices -- > Testing. |
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