Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits / Michael L. Bushnell, Vishwani D. Agrawal
| Main Author: | Bushnell, Michael L. |
|---|---|
| Other Authors: | Agrawal, Vishwani D. |
| Format: | MONOGRAPHS |
| Language: | English |
| Published: |
Boston, MA. : Kluwer Academic Pub., 2000 |
| Subjects: |
Digital integrated circuits --
> Testing.
Integrated circuits -- > Very large scale integration -- > Testing. Mixed signal circuits -- > Testing. Semiconductor storage devices -- > Testing. |
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| 040 | |a DLC |c MUT | ||
| 050 | 4 | |a TK7874.75 |b B87E77 | |
| 100 | 1 | |a Bushnell, Michael L. | |
| 245 | 1 | 0 | |a Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits |b / |c Michael L. Bushnell, Vishwani D. Agrawal |
| 260 | |a Boston, MA. : |b Kluwer Academic Pub., |c 2000 | ||
| 300 | |a xviii, 690 p. : |c 25 cm. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 650 | 0 | |a Digital integrated circuits -- |x Testing. | |
| 650 | 0 | |a Integrated circuits -- |x Very large scale integration -- |x Testing. | |
| 650 | 0 | |a Mixed signal circuits -- |x Testing. | |
| 650 | 0 | |a Semiconductor storage devices -- |x Testing. | |
| 700 | 1 | |a Agrawal, Vishwani D. | |
| 991 | |a MONOGRAPHS |b 5 |c 2018-11-06 22:28:35 |d 2022-03-31 08:25:22 |e mut |f n |g null |h n |i a |j m |k |l a |m |n a |o |p b |q |r mau |s eng |t 2000 |v Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits / | ||