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2000 IEEE International Reliability Physics Symposium : proceedings : 38th annual : San Jose, California, April 10-13, 2000 / International Reliability Physics Symposium

Other Authors: International Reliability Physics Symposium
Format: PROCEEDINGS
Language: English
Published: Piscataway, NJ. : Institute of Electrical and Electronics Engineers, 2000
Subjects: Electronic apparatus and appliances -- > Reliability.
Integrated circuits -- > Reliability.
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Call Number: TK7870 N554 2000
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