2000 IEEE International Reliability Physics Symposium : proceedings : 38th annual : San Jose, California, April 10-13, 2000 / International Reliability Physics Symposium
| Other Authors: | International Reliability Physics Symposium |
|---|---|
| Format: | PROCEEDINGS |
| Language: | English |
| Published: |
Piscataway, NJ. : Institute of Electrical and Electronics Engineers, 2000 |
| Subjects: |
Electronic apparatus and appliances --
> Reliability.
Integrated circuits -- > Reliability. |
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