2000 IEEE International Reliability Physics Symposium : proceedings : 38th annual : San Jose, California, April 10-13, 2000 / International Reliability Physics Symposium
| Other Authors: | International Reliability Physics Symposium |
|---|---|
| Format: | PROCEEDINGS |
| Language: | English |
| Published: |
Piscataway, NJ. : Institute of Electrical and Electronics Engineers, 2000 |
| Subjects: |
Electronic apparatus and appliances --
> Reliability.
Integrated circuits -- > Reliability. |
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| 111 | 2 | |a International Reliability Physics Symposium | |
| 245 | 1 | 0 | |a 2000 IEEE International Reliability Physics Symposium : proceedings : 38th annual : San Jose, California, April 10-13, 2000 |b / |c International Reliability Physics Symposium |
| 260 | |a Piscataway, NJ. : |b Institute of Electrical and Electronics Engineers, |c 2000 | ||
| 300 | |a 456 p. |b : illus. |c ; 25 cm. | ||
| 500 | |a IEEE Catalog No OOCH37059 | ||
| 650 | 0 | |a Electronic apparatus and appliances -- |x Reliability. | |
| 650 | 0 | |a Integrated circuits -- |x Reliability. | |
| 991 | |a PROCEEDINGS |b 6 |c 2018-11-06 21:12:58 |d 2022-04-29 08:56:17 |e mut |f n |g null |h n |i a |j m |k |l a |m |n a |o |p b |q |r nju |s eng |t 2000 |v 2000 IEEE International Reliability Physics Symposium : proceedings : 38th annual : San Jose, California, April 10-13, 2000 / | ||