2000 IEEE International Reliability Physics Symposium : proceedings : 38th annual : San Jose, California, April 10-13, 2000 / International Reliability Physics Symposium
| Other Authors: | International Reliability Physics Symposium |
|---|---|
| Format: | PROCEEDINGS |
| Language: | English |
| Published: |
Piscataway, NJ. : Institute of Electrical and Electronics Engineers, 2000 |
| Subjects: |
Electronic apparatus and appliances --
> Reliability.
Integrated circuits -- > Reliability. |
| Tags: |
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| Item Description: |
IEEE Catalog No OOCH37059 |
|---|---|
| Physical Description: |
456 p. : illus. ; 25 cm. |
| ISBN: |
0780358600 |