VuFind

1999 IEEE International Reliability Physics Symposium : proceedings : 37th annual : San Diego, California, March 23-25, 1999

Corporate Author: International Reliability Physics Symposium
Other Authors: IEEE Reliability Society
Format: MONOGRAPHS
Language: English
Published: Piscataway, NJ. : Institute of Elctrical and Electionk, 1999
Subjects: Electronic apparatus and appliances -- > Reliability.
Integrated circuits -- > Reliability.
Semiconductors -- > Reliability.
Tags: Add
No Tags, Be the first to tag this record!
Item Description: IEEE Catolog No 99cH36296
Physical Description: 1-445 p. : illus. ; 25 cm.
ISBN: 0780352203

Search Options

Find More

Need Help?