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Analog signal generation for built-in-self-test of mixed-signal integrated circuits / Gordon W. Roberts, Albert K. Lu

Main Author: Roberts, Gordon W.
Other Authors: Lu, Albert K.
Format: MONOGRAPHS
Language: English
Published: Boston : Kluwer Academic Pub., 1995
Subjects: Integrated circuits -- > Design and construction.
Integrated circuits -- > Testing.
Signal generators -- > Design and construction.
Signal processing -- > Digital techniques.
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008 181106s9999 xx 000 0 eng d
020 |a 0792395646  |c 2160 
040 |a DLC  |c MUT 
050 4 |a TK872.S5  |b R63A52 
100 1 |a Roberts, Gordon W. 
245 1 0 |a Analog signal generation for built-in-self-test of mixed-signal integrated circuits  |b /  |c Gordon W. Roberts, Albert K. Lu 
260 |a Boston :  |b Kluwer Academic Pub.,  |c 1995 
300 |a viii, 122 p. :  |b illus, charts, graphs, tables ;  |c 23 cm. 
504 |a Includes bibliographical references and index. 
650 0 |a Integrated circuits --  |x Design and construction. 
650 0 |a Integrated circuits --  |x Testing. 
650 0 |a Signal generators --  |x Design and construction. 
650 0 |a Signal processing --  |x Digital techniques. 
700 1 |a Lu, Albert K. 
991 |a MONOGRAPHS  |b 6  |c 2018-11-06 22:29:06  |d 2022-08-08 15:40:23  |e mut  |f n  |g null  |h n  |i a  |j m  |k    |l a  |m    |n a  |o    |p b  |q    |r mau  |s eng  |t 1995   |v Analog signal generation for built-in-self-test of mixed-signal integrated circuits / 

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